Silicon carbide Transparent conductive oxide TCO CYLINDRICAL PORES Growth ADSORPTION DESORPTION HYSTERESIS Nanostructures Nickel 13C Channeling XRD Thin films Nuclear reaction analysis Aluminum Sputtering Bi2Se3 Auger Electron Spectroscopy AES 15N Measurement AC susceptibility Annealing COLLISIONS Analyse par faisceaux d'ions Artificial superlattices Capillary condensation Magnetic anisotropy Al2O3 Silica 6855Jk Zinc oxide NRP X-ray diffraction Ferromagnetic resonance Epitaxy Auger electron spectroscopy AES Passivation Atomic Structure Applied physics Nanoparticles 18O Assessment Indium oxide Ion beam analysis Amorphous carbon 17O Adsorbed layers 18O resonance Pb centers Interface defects Ion implantation 3C-SiC 2H 7550Pp 7550Ee Rutherford backscattering spectrometry RBS Raman spectroscopy Silicon Carbide Adsorption Diffusion Anatase Charge exchange Energy loss Alloys Epitaxial growth Oxidation AFM Metal-insulator transition Magnetization curves Hysteresis ALD Alloy Backscattering spectrometry EPR SiC Nitridation Acoustic propreties of solid CROSS-SECTIONS Gallium oxide Aluminium Ageing GaMnAs Pulsed laser deposition 7630Lh Acoustic Evaluation Anodizing Magnetic semiconductors RBS Amorphous silicon nanoparticles Topological insulators Atomic transport Atomic force microscopy AFM Beta-silicon-carbide Broadband emission Silicon Low energy electron diffraction LEED Stable isotopic tracing 8140Ef Nuclear resonance profiling NRP Photoluminescence Oxygen deficiency