PIXE Backscattering spectrometry AC susceptibility Adsorption SiC Evaluation Rutherford backscattering spectrometry RBS Kossel diffraction Topological insulators Sputtering Interface defects Nanoparticles Raman spectroscopy Magnetic semiconductors Measurement Zinc oxide Hysteresis 7550Ee Auger Electron Spectroscopy AES Nuclear resonance profiling NRP Silicon Channeling NRP Anodizing Pulsed laser deposition Magnetization curves Low energy electron diffraction LEED X-ray diffraction Silica Alloy Nanostructures Applied physics Capillary condensation Adsorbed layers XRD Silicon carbide Metal-insulator transition ADSORPTION DESORPTION HYSTERESIS Artificial superlattices Growth Ion beam analysis 7630Lh Epitaxial growth 13C Aluminium 7550Pp 6855Jk Atomic transport Acoustic propreties of solid Stable isotopic tracing ALD Ageing Auger electron spectroscopy AES 2H EPR Gallium oxide Transparent conductive oxide TCO 3C-SiC Ion implantation Photoluminescence 15N Atomic force microscopy AFM AFM Diffusion Indium oxide Aluminum Passivation Al2O3 Nuclear reaction analysis 17O Analyse par faisceaux d'ions Ferromagnetic resonance Beta-silicon-carbide Oxidation Anatase Periodic multilayer Thin films Epitaxy 18O resonance Magnetic anisotropy Acoustic Energy loss Assessment Density functional theory Amorphous silicon nanoparticles 18O Annealing Nickel Alloys Atomic Structure RBS Silicon Carbide GaMnAs Oxygen deficiency Charge exchange Pb centers 8140Ef Amorphous carbon XPS Nitridation