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Nanometric Thin Films : Formation, Interfaces and Defects
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M. Salimi, O. Kakuee, S. Masoudi, H. Rafi-Kheiri, E. Briand, et al.. Determination and benchmarking of 27Al(d,α) and 27Al(d,p) reaction cross sections for energies and angles relevant to NRA. Scientific Reports, Nature Publishing Group, 2021, 11, pp.18036. ⟨10.1038/s41598-021-97372-7⟩. ⟨hal-03453698⟩
A. Nélis, Ian Vickridge, J.-J. Ganem, E. Briand, G. Terwagne. 18O(p,α)15N isotopic tracing of germanium diffusion in SiO2/Si films. Journal of Applied Physics, American Institute of Physics, 2021, 130 (10), pp.105701. ⟨10.1063/5.0057968⟩. ⟨hal-03453694⟩
Xavier Portier, Christian Hébert, Emrick Briand, Jacques Perriere, Eric Millon, et al.. Microstructure of nanocomposite wurtzite-spinel (Fe:ZnO)-(Zn:Fe3O4) epitaxial films. Materials Chemistry and Physics, Elsevier, 2019, 229, pp.130-138. ⟨10.1016/j.matchemphys.2019.02.089⟩. ⟨hal-02064224⟩
B. Xia, J.J. J Ganem, S. Steydli, H. Tancrez, Ian Vickridge. RBS and NRA analysis for films with high growth rate prepared by atomic layer deposition. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2021, 489, pp.20-25. ⟨10.1016/j.nimb.2020.12.015⟩. ⟨hal-03264045⟩
V. Augustyns, K. van Stiphout, V. Joly, A. Lima, G. Lippertz, et al.. Evidence of tetragonal distortion as the origin of the ferromagnetic ground state in γ − Fe nanoparticles. Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 2017, 96 (17), pp.174410. ⟨10.1103/PhysRevB.96.174410⟩. ⟨hal-01681430⟩
Prachi Rastogi, Audrey Chu, Tung Huu Dang, yoann Prado, Charlie Gréboval, et al.. Complex Optical Index of HgTe Nanocrystal Infrared Thin Films and Its Use for Short Wave Infrared Photodiode Design. Advanced Optical Materials, Wiley, 2021, pp.2002066. ⟨10.1002/adom.202002066⟩. ⟨hal-03161581⟩
Nao Harada, Alban Ferrier, Diana Serrano, Mauro Persechino, Emrick Briand, et al.. Chemically vapor deposited Eu 3+ :Y 2 O 3 thin films as a material platform for quantum technologies. Journal of Applied Physics, American Institute of Physics, 2020, 128 (5), pp.055304. ⟨10.1063/5.0010833⟩. ⟨hal-02913151⟩
Syou-P'Heng Do, Amine Missaoui, Alessandro Coati, Andrea Resta, Nicolas Goubet, et al.. Interactions Between Topological Defects and Nanoparticles. Frontiers in Physics, Frontiers, 2020, 7, pp.234. ⟨10.3389/fphy.2019.00234⟩. ⟨hal-02490728⟩
Ângela Elisa Crespi, Charles Ballage, Marie Christine Hugon, Jacques Robert, Daniel Lundin, et al.. Low resistivity amorphous carbon-based thin films employed as anti-reflective coatings on copper. Thin Solid Films, Elsevier, 2020, 712, pp.138319. ⟨10.1016/j.tsf.2020.138319⟩. ⟨hal-02929173⟩
M. Rudolph, I. Vickridge, E. Foy, J. Alvarez, Jean-Paul Kleider, et al.. Oxygen incorporated during deposition determines the crystallinity of magnetron-sputtered Ta3N5 films. Thin Solid Films, Elsevier, 2019, 685, pp.204-209. ⟨10.1016/j.tsf.2019.06.031⟩. ⟨hal-02271107⟩
Full text articles
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Keywords
13C
Pulsed laser deposition
Interface defects
Evaluation
Auger electron spectroscopy AES
Nuclear reaction analysis
Nanoparticles
Adsorbed layers
Aluminium
PIXE
15N
Nuclear resonance profiling NRP
Kossel diffraction
ADSORPTION DESORPTION HYSTERESIS
Amorphous carbon
18O
Epitaxial growth
Density functional theory
Ion implantation
Auger Electron Spectroscopy AES
Amorphous silicon nanoparticles
Pb centers
Magnetic semiconductors
Periodic multilayer
Gallium oxide
2H
Oxidation
Ageing
Aluminum
Transparent conductive oxide TCO
Acoustic
SiC
Sputtering
Applied physics
Oxygen deficiency
X-ray diffraction
Topological insulators
NRP
Rutherford backscattering spectrometry RBS
AC susceptibility
6855Jk
Adsorption
7630Lh
XPS
RBS
XRD
Diffusion
Nickel
GaMnAs
Ion beam analysis
Charge exchange
Stable isotopic tracing
Passivation
Nanostructures
Acoustic propreties of solid
Epitaxy
Atomic Structure
Ferromagnetic resonance
Channeling
Silicon carbide
Anodizing
Capillary condensation
Atomic force microscopy AFM
Atomic Layer Deposition ALD
Zinc oxide
Growth
Nitridation
Multilayer
Silicon Carbide
Thin films
Low energy electron diffraction LEED
EPR
Energy loss
Atomic transport
Photoluminescence
Assessment
Analyse par faisceaux d'ions
Indium oxide
Magnetic anisotropy
18O resonance
Artificial superlattices
17O
Anatase
Metal-insulator transition
Al2O3
3C-SiC
Hysteresis
Annealing
Alloys
Raman spectroscopy
Silicon
8140Ef
Magnetization curves
Alloy
7550Pp
7550Ee
AFM
ALD
Silica
Measurement