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SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety

Abstract : We propose a Built-In Self-Test (BIST) paradigm for analog and mixed-signal (A/M-S) Integrated Circuits (ICs), called symmetry-based BIST (SymBIST). SymBIST exploits inherent symmetries in an A/M-S IC to construct signals that are invariant by default, and subsequently checks those signals against a tolerance window. Violation of invariant properties points to the occurrence of a defect or abnormal operation. SymBIST is designed to serve as a functional safety mechanism. It is reusable ranging from post-manufacturing test, where it targets defect detection, to on-line test in the field of operation, where it targets low-latency detection of transient failures and degradation due to aging. We demonstrate SymBIST on a Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC). SymBIST features high defect coverage, short test time, low overhead, zero performance penalty, and has a fully digital interface making it compatible with modern digital test access mechanisms. Index Terms-Analog and mixed-signal integrated circuit testing, built-in self-test, design-for-test, defect-oriented test, defect simulation, on-line test, concurrent error detection.
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https://hal.archives-ouvertes.fr/hal-03171195
Contributor : Haralampos Stratigopoulos Connect in order to contact the contributor
Submitted on : Tuesday, March 16, 2021 - 6:17:42 PM
Last modification on : Tuesday, March 23, 2021 - 9:28:02 AM
Long-term archiving on: : Thursday, June 17, 2021 - 8:01:14 PM

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  • HAL Id : hal-03171195, version 1

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Antonios Pavlidis, Marie-Minerve Louërat, Eric Faehn, Anand Kumar, Haralampos-G. Stratigopoulos. SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety. IEEE Transactions on Circuits and Systems I: Regular Papers, IEEE, inPress. ⟨hal-03171195⟩

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