Correlation between composition, microstructure, and emission properties in Nd-doped Si-rich Si oxynitride films: investigation into the nature of the sensitizer

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Submitted on : Monday, December 3, 2018 - 11:29:43 AM
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C-H Liang, Y-T An, W Jin, D-C Meng, W. Wang, et al.. Correlation between composition, microstructure, and emission properties in Nd-doped Si-rich Si oxynitride films: investigation into the nature of the sensitizer. Nanotechnology, Institute of Physics, 2019, 30 (4), pp.045702. ⟨hal-01942470⟩

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